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Interface Modifications of Lead Zirconate Titanate Thin Films.
- Source :
- Ferroelectrics; 2010, Vol. 402 Issue 1, p43-46, 4p
- Publication Year :
- 2010
-
Abstract
- Electrical properties of ferroelectric thin films depend on the quality of not only the ferroelectric thin layer but also the ferroelectric/electrode interfaces. In the present study, attempts were made to minimize the Pb depletion at the bottom electrode/ferroelectric interface in lead zirconate titanate ferroelectric thin films by adding a PbO interfacial layer using a chemical solution deposition method. The crystallographic structure of the PZT thin films with and without PbO layer were examined by X-ray diffraction. The microstructure of the thin film samples was characterized using optical microscope and atomic force microscope. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00150193
- Volume :
- 402
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Ferroelectrics
- Publication Type :
- Academic Journal
- Accession number :
- 55310291
- Full Text :
- https://doi.org/10.1080/00150191003697328