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Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy.
- Source :
- Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1084-1085, 2p
- Publication Year :
- 2009
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 15
- Issue :
- S2
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 57326244
- Full Text :
- https://doi.org/10.1017/S1431927609093908