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Thermal Conductance Measurements of a Micron-Sized Transition-Edge Hot-Electron Micro-Bolometer.

Authors :
Barrentine, Emily M.
Brandl, Donald E.
Brown, Ari D.
Denis, Kevin L.
Hsieh, Wen-Ting
Nagler, Peter C.
Stevenson, Thomas R.
Talley, Dorothy J.
Timbie, Peter T.
U-Yen, Kongpop
Source :
IEEE Transactions on Applied Superconductivity; Jun2011, Vol. 21 Issue 3, p258-261, 4p
Publication Year :
2011

Abstract

Future ground and space-based astronomy missions in the millimeter and sub-millimeter range will rely upon kilopixel detector arrays. We are developing a superconducting Transition-Edge Hot-Electron Bolometer (THM) for use in these next generation missions. Thermal isolation of the THM is controlled by the hot-electron effect between the electrons and phonons within the small volume of the superconducting detector. To reach noise levels near the photon background noise for observing the Cosmic Microwave Background (CMB) and the submillimeter and far-infrared background the optimal detector size occurs at the micron length scale. We present measurements of the thermal conductance of two micron-sized THM devices which show a hot-electron temperature dependence and predict NEP\leq 5\times 10^-18\ W/\sqrtHz for CMB loading conditions and NEP\leq 1\times 10^-19\ W\sqrtHz in the low power loading limit. We also briefly discuss the detector geometry and thermal conductance optimization for CMB loading conditions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10518223
Volume :
21
Issue :
3
Database :
Complementary Index
Journal :
IEEE Transactions on Applied Superconductivity
Publication Type :
Academic Journal
Accession number :
60967839
Full Text :
https://doi.org/10.1109/TASC.2010.2089961