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Adapted waveform analysis as a tool for modeling, feature extraction, and denoising.

Authors :
Coifman, Ronald R.
Wickerhauser, Mladen Victor
Source :
Optical Engineering; Jul1994, Vol. 33 Issue 7, p2170-2174, 5p
Publication Year :
1994

Details

Language :
English
ISSN :
00913286
Volume :
33
Issue :
7
Database :
Complementary Index
Journal :
Optical Engineering
Publication Type :
Academic Journal
Accession number :
61220948

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