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Layout Technique for Single-Event Transient Mitigation via Pulse Quenching.
Layout Technique for Single-Event Transient Mitigation via Pulse Quenching.
- Source :
- IEEE Transactions on Nuclear Science; Jun2011 Part 2, Vol. 58 Issue 3, p885-890, 6p
- Publication Year :
- 2011
-
Abstract
- A layout technique that exploits single-event transient pulse quenching to mitigate transients in combinational logic is presented. TCAD simulations show as much as 60% reduction in sensitive area and 70% reduction in pulse width for some logic cells. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 58
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 61254741
- Full Text :
- https://doi.org/10.1109/TNS.2010.2097278