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Layout Technique for Single-Event Transient Mitigation via Pulse Quenching.

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching.

Authors :
Atkinson, Nicholas M.
Witulski, Arthur F.
Holman, W. Timothy
Ahlbin, Jonathan R.
Bhuva, Bharat L.
Massengill, Lloyd W.
Source :
IEEE Transactions on Nuclear Science; Jun2011 Part 2, Vol. 58 Issue 3, p885-890, 6p
Publication Year :
2011

Abstract

A layout technique that exploits single-event transient pulse quenching to mitigate transients in combinational logic is presented. TCAD simulations show as much as 60% reduction in sensitive area and 70% reduction in pulse width for some logic cells. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
58
Issue :
3
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
61254741
Full Text :
https://doi.org/10.1109/TNS.2010.2097278