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Design and performance verification of a microscope-based interferometer for miniature-specimen metrology.

Authors :
Chih-Kung Lee
Wen-Jong Wu
Giin-Yuan Wu
Chia-Ling Li
Zeng-De Chen
Jau-Yu Chen
Source :
Optical Engineering; Aug2005, Vol. 44 Issue 8, p085602-1-085602-8, 8p
Publication Year :
2005

Details

Language :
English
ISSN :
00913286
Volume :
44
Issue :
8
Database :
Complementary Index
Journal :
Optical Engineering
Publication Type :
Academic Journal
Accession number :
61282640
Full Text :
https://doi.org/10.1117/1.2010147