Coherent diffraction microscopy at SPring-8: instrumentation, data acquisition and data analysis.

The article presents the instrumentation and experimental procedures for measuring diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8. It provides a detailed account of the instrumentation, experimental procedures and post-experimental data analysis in coherent X-ray diffraction microscopy (CXDM) that yields high-quality image reconstructions. It also discusses the estimation of the central pixel of measured diffraction patterns.