Automatic fast fitting of single Langmuir probe characteristics on RFX

Authors :: Bagatin, M.
Desideri, D.
Martines, E.
Manduchi, G.
Serianni, G.
Antoni, V.
Source :: Review of Scientific Instruments; Jan1997, Vol. 68 Issue 1, p365, 4p, 11 Graphs
Publication Year :: 1997
Abstract: Describes three different methods for automatic analysis of the large number of current-voltage characteristics of single Langmuir probes used in the RFX reversed field pinch for time-resolved measurements of edge electron density and temperature. Fitting procedure; Neural network method; Minimum temperature approach; Cost function approach.