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High resolution electron microscopy of amorphous interlayers between metal thin films and silicon.
- Source :
- Microscopy Research & Technique; Jan1998, Vol. 40 Issue 2, p136-151, 16p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 1059910X
- Volume :
- 40
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Microscopy Research & Technique
- Publication Type :
- Academic Journal
- Accession number :
- 63342270
- Full Text :
- https://doi.org/10.1002/(SICI)1097-0029(19980115)40:2<136::AID-JEMT5>3.0.CO;2-T