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Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/In xGa1- xN structures using optical conductivity enhancement.
- Source :
- Rapid Communications in Mass Spectrometry: RCM; Jul2010, Vol. 24 Issue 14, p2122-2126, 5p
- Publication Year :
- 2010
Details
- Language :
- English
- ISSN :
- 09514198
- Volume :
- 24
- Issue :
- 14
- Database :
- Complementary Index
- Journal :
- Rapid Communications in Mass Spectrometry: RCM
- Publication Type :
- Academic Journal
- Accession number :
- 64194441
- Full Text :
- https://doi.org/10.1002/rcm.4623