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AlN/AlGaN/GaN MIS-HEMTs with recessed source/drain Ohmic contact.

Authors :
Selvaraj, S. Lawrence
Ito, Tsuneo
Terada, Yutaka
Egawa, Takashi
Source :
Physica Status Solidi (C); Jul2008, Vol. 5 Issue 9, p2988-2990, 3p
Publication Year :
2008

Details

Language :
English
ISSN :
18626351
Volume :
5
Issue :
9
Database :
Complementary Index
Journal :
Physica Status Solidi (C)
Publication Type :
Academic Journal
Accession number :
64959132
Full Text :
https://doi.org/10.1002/pssc.200779294