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Resolution enhancement technique optimization using model-based full-chip verification methodology for subwavelength lithography.
- Source :
- Proceedings of SPIE; Nov2004, Issue 1, p1168-1177, 10p
- Publication Year :
- 2004
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65614771
- Full Text :
- https://doi.org/10.1117/12.569294