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Stress relaxation in nanoscale aluminum films.

Authors :
Hyun, Seungmin
Brown, Walter L.
Vinci, Richard P.
Source :
Proceedings of SPIE; Nov2004, Issue 1, p154-162, 9p
Publication Year :
2004

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65625325
Full Text :
https://doi.org/10.1117/12.529632