Back to Search
Start Over
Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit.
- Source :
- Proceedings of SPIE; Nov1998 Part 2, Issue 1, p595-600, 6p
- Publication Year :
- 1998
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65652031
- Full Text :
- https://doi.org/10.1117/12.318448