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X-ray spectroscopy and calibrations in the 50- to 60-keV range.

Authors :
Seely, John F.
Hudson, Lawrence T.
Weaver, James L.
Holland, Glenn E.
Boyer, Craig N.
Source :
Proceedings of SPIE; Nov2002, Issue 1, p183-188, 6p
Publication Year :
2002

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65669850
Full Text :
https://doi.org/10.1117/12.451750