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An improved normalized cross-correlation algorithm for inspection of printed circuit boards.

Authors :
Wang, Fuming
Source :
Proceedings of SPIE; Nov2006, Issue 1, p635719-635719-5, 5p
Publication Year :
2006

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65725686
Full Text :
https://doi.org/10.1117/12.716957