Back to Search
Start Over
Global pattern density effects on low-k trench CDs for sub-65-nm technology nodes.
- Source :
- Proceedings of SPIE; Nov2006, Issue 1, p615205-615205-8, 8p
- Publication Year :
- 2006
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65735702
- Full Text :
- https://doi.org/10.1117/12.656409