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Reduction of low-level current leakage in CMOS devices.

Authors :
Kong, George Y.
Healey, Jerry T.
Source :
Proceedings of SPIE; 11/ 1/1994, Issue 1, p180-194, 15p
Publication Year :
1994

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65848010
Full Text :
https://doi.org/10.1117/12.186748