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0.25-m lithography using a 50-kV shaped electron-beam vector scan system.

Authors :
Gesley, Mark A.
Mulera, Terry
Nurmi, C.
Radley, J.
Sagle, Allan L.
Standiford, Keith P.
Tan, Zoilo C. H.
Thomas, John R.
Veneklasen, Lee
Source :
Proceedings of SPIE; Nov1995, Issue 1, p168-184, 17p
Publication Year :
1995

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
65864958
Full Text :
https://doi.org/10.1117/12.209157