Back to Search
Start Over
Using advanced diagnostics to detect subsurface damage in sapphire.
- Source :
- Proceedings of SPIE; Nov1997, Issue 1, p272-283, 12p
- Publication Year :
- 1997
Details
- Language :
- English
- ISSN :
- 0277786X
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Proceedings of SPIE
- Publication Type :
- Conference
- Accession number :
- 65876070
- Full Text :
- https://doi.org/10.1117/12.295133