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Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps.

Authors :
Darbal, A
Ganesh, K
Barmak, K
Rohrer, G
Ferreira, P
Sun, T
Coffey, K
Source :
Microscopy & Microanalysis; Jul2011 Supplement, Vol. 17 Issue S2, p1426-1427, 2p
Publication Year :
2011

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]

Subjects

Subjects :
CRYSTAL grain boundaries
NANOCRYSTALS

Details

Language :
English
ISSN :
14319276
Volume :
17
Issue :
S2
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
66427419
Full Text :
https://doi.org/10.1017/S1431927611008002
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