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Optical properties of SrSe thin films grown by molecular beam epitaxy.
- Source :
- Journal of Applied Physics; 6/1/2002, Vol. 91 Issue 11, p9015, 4p, 4 Graphs
- Publication Year :
- 2002
-
Abstract
- Absorption, reflection and Raman scattering measurements have been carried out for the optical properties of a SrSe thin film grown by molecular beam epitaxy on a BaF[sub 2] (111) substrate. The film quality and lattice constant have been assessed by x-ray diffraction, where the good quality of the SrSe thin film is evident in a full width at half maximum value of 310 arcsec. Temperature-dependent indirect band gaps are obtained with the aid of temperature-dependent absorption measurements from 16 to 300 K on the SrSe thin film. By fitting the far-infrared reflection spectra, transverse optical phonon reflection bands in the binary SrSe thin film have been assigned, which are further verified by temperature-dependent Raman scattering measurements. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 91
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 6694750
- Full Text :
- https://doi.org/10.1063/1.1474593