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Laser linewidth measurement based on image processing and non-air gap F-P etalon.

Authors :
Zhang, He-yong
Zhao, Wei-jiang
Ren, De-ming
Qu, Yan-chen
Source :
Proceedings of SPIE; Nov2009 Part 3, Issue 1, p73840Z-73840Z-8, 8p
Publication Year :
2009

Details

Language :
English
ISSN :
0277786X
Issue :
1
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
67390266
Full Text :
https://doi.org/10.1117/12.835109