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Delamination of Grain-Interfaces in Silicon Nitride.

Authors :
Wippler, Johannes
Böhlke, Thomas
Source :
PAMM: Proceedings in Applied Mathematics & Mechanics; Dec2011, Vol. 11 Issue 1, p183-184, 2p
Publication Year :
2011

Details

Language :
English
ISSN :
16177061
Volume :
11
Issue :
1
Database :
Complementary Index
Journal :
PAMM: Proceedings in Applied Mathematics & Mechanics
Publication Type :
Academic Journal
Accession number :
69538274
Full Text :
https://doi.org/10.1002/pamm.201110083