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Improved amorphous/crystalline silicon interface passivation by hydrogen plasma treatment.

Authors :
Descoeudres, A.
Barraud, L.
De Wolf, Stefaan
Strahm, B.
Lachenal, D.
Guérin, C.
Holman, Z. C.
Zicarelli, F.
Demaurex, B.
Seif, J.
Holovsky, J.
Ballif, C.
Source :
Applied Physics Letters; 9/19/2011, Vol. 99 Issue 12, p123506, 3p, 1 Chart, 4 Graphs
Publication Year :
2011

Abstract

Silicon heterojunction solar cells have high open-circuit voltages thanks to excellent passivation of the wafer surfaces by thin intrinsic amorphous silicon (a-Si:H) layers deposited by plasma-enhanced chemical vapor deposition. We show a dramatic improvement in passivation when H2 plasma treatments are used during film deposition. Although the bulk of the a-Si:H layers is slightly more disordered after H2 treatment, the hydrogenation of the wafer/film interface is nevertheless improved with as-deposited layers. Employing H2 treatments, 4 cm2 heterojunction solar cells were produced with industry-compatible processes, yielding open-circuit voltages up to 725 mV and aperture area efficiencies up to 21%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
99
Issue :
12
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
70945956
Full Text :
https://doi.org/10.1063/1.3641899