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Image processing in secondary ion mass spectrometry.

Authors :
Vanhoolst, Wim
Espen, Pierre
Source :
Microchimica Acta; 1991, Vol. 104 Issue 1-6, p415-425, 11p
Publication Year :
1991

Abstract

The application of image processing in secondary ion mass spectrometry is discussed. The Cameca 4f SIMS uses a single microchannel plate and a highly sensitive camera in combination with an image processor with real time capabilities (Kontron IBAS). An automation procedure with image integration, extended dynamic range image acquisition and retro depth profiling is presented and illustrated with practical applications. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00263672
Volume :
104
Issue :
1-6
Database :
Complementary Index
Journal :
Microchimica Acta
Publication Type :
Academic Journal
Accession number :
71037214
Full Text :
https://doi.org/10.1007/BF01245527