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Measurement of cube-root broadening of charge packets in metal-oxide- semiconductor structures.
- Source :
- Applied Physics Letters; 1983, Vol. 42 Issue 9, p815-817, 3p
- Publication Year :
- 1983
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 42
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 71388376
- Full Text :
- https://doi.org/10.1063/1.94106