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Modifying the nanocrystalline characteristics—structure, size, and surface states of copper oxide thin films by high-energy heavy-ion irradiation.
- Source :
- Journal of Applied Physics; 9/15/2002, Vol. 92 Issue 6, p3304, 7p, 1 Chart, 9 Graphs
- Publication Year :
- 2002
-
Abstract
- In the present study, x-ray diffraction, Raman spectroscopy, spectroscopic ellipsometry, photoluminescence, and x-ray photoelectron spectroscopy techniques were used to study the effect of 120 MeV [sup 107]Ag[sup 9+] ion irradiation on nanocrystalline Cu[sub 2]O thin films grown by the activated reactive evaporation technique. The influence of dense electronic excitations during ion irradiation on the structural and optical properties of the Cu[sub 2]O thin films was studied. Experimental results demonstrate that the phase and the size of nanocrystallites in the Cu[sub 2]O thin films as well as associated surface states can be tailored by controlling ion fluence. The Cu[sub 2]O higher symmetry cubic phase is observed to be quite stable under a higher temperature and irradiation-induced thermal spikes, which accompanies ion irradiation. [ABSTRACT FROM AUTHOR]
- Subjects :
- COPPER oxide
THIN films
HEAVY ions
RAMAN spectroscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 92
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7240565
- Full Text :
- https://doi.org/10.1063/1.1499752