Back to Search
Start Over
RF/Microwave non-destructive measurements of electrical properties of semiconductor wafers for thermophotovoltaic applications.
- Source :
- AIP Conference Proceedings; Mar1997, Vol. 401 Issue 1, p139-155, 17p
- Publication Year :
- 1997
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 401
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 72851664
- Full Text :
- https://doi.org/10.1063/1.53278