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Connection between sources formalism and correlation formalism for transport noise: Application to injection diodes.

Authors :
van Vliet, K. M.
Blasquez, G.
Source :
Journal of Applied Physics; Feb1976, Vol. 47 Issue 2, p768-771, 4p
Publication Year :
1976

Details

Language :
English
ISSN :
00218979
Volume :
47
Issue :
2
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72862861
Full Text :
https://doi.org/10.1063/1.322646