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An x-ray optical study of layered phase growth in Au-Al thin film couples.

Authors :
Wagendristel, A.
Schurz, H.
Ehrmann-Falkenau, E.
Bangert, H.
Source :
Journal of Applied Physics; Sep1980, Vol. 51 Issue 9, p4808-4812, 5p
Publication Year :
1980

Details

Language :
English
ISSN :
00218979
Volume :
51
Issue :
9
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72867369
Full Text :
https://doi.org/10.1063/1.328313