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Ion-beam-induced atomic mixing and amorphization in Ti/Ni bilayered thin films.

Authors :
Saito, K.
Iwaki, M.
Source :
Journal of Applied Physics; Jun1984, Vol. 55 Issue 12, p4447-4449, 3p
Publication Year :
1984

Details

Language :
English
ISSN :
00218979
Volume :
55
Issue :
12
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
72872216
Full Text :
https://doi.org/10.1063/1.333018