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X-Ray Diffraction Method for Determining Strain Distributions in Thin Metallic Films with Application to Gold Films.

Authors :
McDowell, C. Blake
Pilkington, Theo C.
Source :
Journal of Applied Physics; Jun1971, Vol. 42 Issue 7, p2958-2970, 13p
Publication Year :
1971

Details

Language :
English
ISSN :
00218979
Volume :
42
Issue :
7
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
73367196
Full Text :
https://doi.org/10.1063/1.1660655