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The effect of an energy-dependent capture cross section on data interpretation using the MOS conductance technique.

Authors :
Cooper, J. A.
Schwartz, R. J.
Source :
Journal of Applied Physics; Dec1973, Vol. 44 Issue 12, p5613-5614, 2p
Publication Year :
1973

Details

Language :
English
ISSN :
00218979
Volume :
44
Issue :
12
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
73370107
Full Text :
https://doi.org/10.1063/1.1662205