Electron Microscope Technique for In Situ Observation of Memory Element through Deposited Word and Digit Lines.

Details

Language :

English

ISSN :

00346748

Volume :

42

Issue :

10

Database :

Complementary Index

Journal :

Review of Scientific Instruments

Publication Type :

Academic Journal

Accession number :

73403318

Full Text :

https://doi.org/10.1063/1.1684924