Closed-form expressions of distributed RLC interconnects for analysis of on-chip inductance effects.

Details

Language :

English

ISSN :

0738100X

Database :

Complementary Index

Journal :

DAC: Annual ACM/IEEE Design Automation Conference

Publication Type :

Conference

Accession number :

73578084

Full Text :

https://doi.org/10.1145/996566.996783