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Effect of the annealing treatments on the electroluminescence efficiency of SiO2 layers doped with Si and Er.

Authors :
Jambois, O.
Ramírez, J. M.
Berencén, Y.
Navarro-Urrios, D.
Anopchenko, A.
Marconi, A.
Prtljaga, N.
Tengattini, A.
Pellegrino, P.
Daldosso, N.
Pavesi, L.
Colonna, J-P
Fedeli, J-M
Garrido, B.
Source :
Journal of Physics D: Applied Physics; 2/21/2012, Vol. 45 Issue 4, p1-5, 5p
Publication Year :
2012

Abstract

We studied the effect of rapid thermal processing and furnace annealing on the transport properties and electroluminescence (EL) of SiO<subscript>2</subscript> layers doped with Si and Er ions. The results show that for the same annealing temperature, furnace annealing decreases the electrical conductivity and increases the probability of impact excitation, which leads to an improved external quantum efficiency. Correlations between predictions from phenomenological transport models, annealing regimes and erbium EL are observed and discussed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00223727
Volume :
45
Issue :
4
Database :
Complementary Index
Journal :
Journal of Physics D: Applied Physics
Publication Type :
Academic Journal
Accession number :
73832603
Full Text :
https://doi.org/10.1088/0022-3727/45/4/045103