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Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x-ray photoemission spectromicroscopy.
- Source :
- Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 2, p1527-1530, 4p
- Publication Year :
- 1996
Details
- Language :
- English
- ISSN :
- 10711023
- Volume :
- 14
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
- Publication Type :
- Academic Journal
- Accession number :
- 74341523
- Full Text :
- https://doi.org/10.1116/1.589132