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High-resolution silicon patterning with self-assembled monolayer resists.

Authors :
Lercel, M. J.
Whelan, C. S.
Craighead, H. G.
Seshadri, K.
Allara, D. L.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1996, Vol. 14 Issue 6, p4085-4090, 6p
Publication Year :
1996

Details

Language :
English
ISSN :
10711023
Volume :
14
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
74342060
Full Text :
https://doi.org/10.1116/1.588596