Back to Search Start Over

3rd International Symposium on Reliability of Optoelectronics for Space (ISROS 2012).

Source :
IEEE Electron Device Letters; May2012, Vol. 33 Issue 5, p735-735, 1p
Publication Year :
2012

Abstract

The article offers information on the International Symposium on Reliability of Optoelectronics for Space (ISROS) to be held in Italy from October 1-5, 2012 and also invites optoelectronics-related papers to be submitted for the symposium.

Details

Language :
English
ISSN :
07413106
Volume :
33
Issue :
5
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
74576431
Full Text :
https://doi.org/10.1109/LED.2012.2196155