Back to Search Start Over

Preparation of microcrystalline Si1-xCx thin films.

Authors :
Fujii, Yoshihisa
Hatano, Akitsugu
Suzuki, Akira
Yoshida, Masaru
Nakajima, Shigeo
Source :
Journal of Applied Physics; 2/15/1987, Vol. 61 Issue 4, p1657, 3p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 2 Graphs
Publication Year :
1987

Abstract

Presents a study wherein Si[sub1-x]C[subx] thin films were prepared by glow discharge method in a hydrogen-rich atmosphere at low substrate temperature. Superior properties of microcrystalline silicon to hydrogenated amorphous silicon; Measurement of the properties of Si[sub1-x]C[subx] thin films; Description of the reflection high-energy electron diffraction and optical absorption.

Details

Language :
English
ISSN :
00218979
Volume :
61
Issue :
4
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7628689
Full Text :
https://doi.org/10.1063/1.338057