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Negative charging in ultrathin metal-oxide-silicon tunnel diodes.
- Source :
- Journal of Applied Physics; 2/15/1992, Vol. 71 Issue 4, p1846, 7p
- Publication Year :
- 1992
-
Abstract
- Studies the negative charging in ultrathin metal-oxide-silicon tunnel diodes. Focus of the study; Details on the experiment; Physical model of the device conductance.
- Subjects :
- ELECTRIC discharges
DIODES
METAL oxide semiconductors
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 71
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7629578
- Full Text :
- https://doi.org/10.1063/1.351169