In situ x-ray diffraction studies of YBa2Cu3Ox.

Authors :: Williams, S.
Zheng, J. Q.
Shih, M. C.
Wang, X. K.
Lee, S. J.
Rippert, E. D.
Maglic, S.
Kajiyama, Hiroshi
Segel, D.
Dutta, P.
Chang, R. P. H.
Ketterson, J. B.
Roberts, T.
Lin, Y.
Kampwirth, R. T.
Gray, K.
Source :: Journal of Applied Physics; 11/15/1992, Vol. 72 Issue 10, p4798, 7p
Publication Year :: 1992
Abstract: Deals with a study which examined in situ x-ray diffraction studies of the growth of thin films using a synchrotron light source. Information on an off-axis faced magnetron sputtering chamber; Methodology of the study; Results and discussion.