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Effect of annealing temperature on the hole concentration and lattice relaxation of carbon-doped GaAs and AlxGa1-xAs.

Authors :
Höfler, G. E.
Höfler, H. J.
Holonyak, N.
Hsieh, K. C.
Source :
Journal of Applied Physics; 12/1/1992, Vol. 72 Issue 11, p5318, 7p, 6 Graphs
Publication Year :
1992

Abstract

Provides information on hole density in carbon-doped gallium arsenide and aluminum-gallium-arsenic as a function of the annealing temperature. Cause of an increase in lattice parameter of the carbon-doped epilayer; Direct determination of the lattice site location of carbon in samples; Information on the microstructural quality of the film; Use of transmission electron microscopy.

Details

Language :
English
ISSN :
00218979
Volume :
72
Issue :
11
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7644877