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The bonded unipolar silicon-silicon junction.
- Source :
- Journal of Applied Physics; 7/1/1992, Vol. 72 Issue 1, p124, 17p, 2 Diagrams, 13 Charts, 2 Graphs
- Publication Year :
- 1992
-
Abstract
- Investigates the electrical and optical properties of wafer bonded unipolar silicon-silicon junctions. Capacitance of the bonded structures; Effect of the photogenerated increase in the minority carrier concentration in the interfacial region; Reason for the increased concentration of deep electron traps in the vicinity of the bonded interface.
- Subjects :
- SILICON
ELECTRONS
DIFFUSION bonding (Metals)
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 72
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7651200
- Full Text :
- https://doi.org/10.1063/1.352172