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Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films.
- Source :
- Journal of Applied Physics; 11/1/1989, Vol. 66 Issue 9, p4258, 4p
- Publication Year :
- 1989
-
Abstract
- Studies the three-dimensional image of the surface roughness of sputtered iron-oxide thin films obtained using a scanning tunneling microscope. Limitations of the electron microscopy for surface three-dimensional studies; Details on the experiment; Discussion on the results of the study.
- Subjects :
- GEOMETRIC surfaces
IRON oxides
THIN films
SCANNING tunneling microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 66
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7655043