Back to Search Start Over

Exploiting Die-to-Die Thermal Coupling in 3D IC Placement.

Authors :
Athikulwongse, Krit
Pathak, Mohit
Sung Kyu Lim
Source :
DAC: Annual ACM/IEEE Design Automation Conference; Jun2012, p741-746, 6p
Publication Year :
2012

Abstract

In this paper, we propose two methods used in 3D IC placement that effectively exploit the die-to-die thermal coupling in the stack. First, TSVs are spread on each die to reduce the local power den- sity and vertically aligned across dies simultaneously to increase thermal conductivity to the heatsink. Second, we move high-power logic cells to the location that has higher conductivity to the heatsink while moving TSVs in the upper dies so that high-power cells are vertically overlapping below the TSVs. These methods are em- ployed in a force-directed 3D placement successfully and outper- form several state-of-the-art placers published in recent literature. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0738100X
Database :
Complementary Index
Journal :
DAC: Annual ACM/IEEE Design Automation Conference
Publication Type :
Conference
Accession number :
76581410