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Grain boundary diffusion effects on the sputter depth profiles of Co–Ag bilayers.
- Source :
- Journal of Applied Physics; 4/1/1996, Vol. 79 Issue 7, p3534, 7p, 1 Black and White Photograph, 1 Diagram, 5 Graphs
- Publication Year :
- 1996
-
Abstract
- Presents a study which investigated the effects of surface roughness and grain boundary diffusion at elevated temperatures on the Auger-electron-spectroscopy sputter depth profiles of cobalt-silver bilayers and the grain boundary process of silver atoms in cobalt. Introduction to sputter depth profiling; Description of the experimental setup; Results.
- Subjects :
- KIRKENDALL effect
SURFACE roughness
COBALT
SILVER
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 79
- Issue :
- 7
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7658453
- Full Text :
- https://doi.org/10.1063/1.361405