Exploring Electronic Transport in Molecular Junctions by Conducting Atomic Force Microscopy.

Measuring the electronic transport properties of single molecules and molecular nanostructures is an interesting and challenging new frontier from both a fundamental as well as technological perspective. Conducting atomic force microscopy (C-AFM) represents an attractive line of approach given its ability to position a sharp electrical probe with nanometer-scale precision and a controlled nano-Newton-range force. Moreover, the combination of AFM imaging and C-AFM electrical characterization enables investigation of the relationship between structure and function in molecular architectures. The aim of the present review is twofold: (1) to introduce the C-AFM method, alongside a discussion of experimental practices, capabilities and limitations, and (2) to provide an overview of the application of C-AFM to different types of molecular systems. These include alkane-based and oligomer-based self-assembled monolayers, molecular crystals, conducting polymer films, molecular wires (e.g. carbon nanotubes), and electrically active biomolecules. We will also discuss C-AFM approaches that allow single molecule measurements as well as other recent developments. [ABSTRACT FROM AUTHOR]