Evidence for Voltage-Driven Set/Reset Processes in Bipolar Switching RRAM.

MLA

Ielmini, Daniele, et al. “Evidence for Voltage-Driven Set/Reset Processes in Bipolar Switching RRAM.” IEEE Transactions on Electron Devices, vol. 59, no. 8, Aug. 2012, pp. 2049–56. EBSCOhost, https://doi.org/10.1109/TED.2012.2199497.

APA

Ielmini, D., Nardi, F., & Balatti, S. (2012). Evidence for Voltage-Driven Set/Reset Processes in Bipolar Switching RRAM. IEEE Transactions on Electron Devices, 59(8), 2049–2056. https://doi.org/10.1109/TED.2012.2199497

Chicago

Ielmini, Daniele, Federico Nardi, and Simone Balatti. 2012. “Evidence for Voltage-Driven Set/Reset Processes in Bipolar Switching RRAM.” IEEE Transactions on Electron Devices 59 (8): 2049–56. doi:10.1109/TED.2012.2199497.